Non-contact open / short testing is an innovative defect-detecting technology for LCD. High Scanning speed provide excellent solution for mass production.

Micro Drilling down to 0.2mm using Ultrasonic Technology
High-Precision Machinery for TFT Flat Panel & Semiconductor Upper Electrode Processing

Racus range for all FKM / FFKM requirements
Quality seamless splice products

FPC field by using electrical testing technology with contact probes or sensor technology.